Published Abstracts and Papers

Contents

• Llovet, at. al., "Secondary fluorescence in electron probe microanalysis of couple materials", J. Appl. Phys., (2012)
• Donovan, et. al., "High Speed Matrix and Secondary Fluorescence Effects From Fundamental Parameter Monte Carlo Calculations" (M&M, 2012)

• Donovan, et. al., "An Improved Interference Correction for Trace Element Analysis" (Microbeam Analysis, 1993)
• Donovan and Tingle, "An Improved Mean Atomic Number Background Correction for Quantitative Microanalysis" (Jour. of Micros. Microa, 1996)

• Donovan, "Practical Considerations for Mosaic Imaging in Electron Beam Instruments" (Scanning)

• Donovan, and Pingitore, "Compositional Averaging of Continuum Intensities in Multi-Element Compounds" (M&M, 2002)
• Donovan, et. al., "Compositional Averaging of Backscatter Intensities in Compounds" (M&M, 2003)
• Donovan, "Compositional Averaging of Backscatter Intensities in Compounds"- Comment by Reed and Response to Reed (M&M, 2003)

• Donovan, et. al., "A re-examination of the rare-earth-element orthophosphate standards in use for electron-probe microanalysis:, Cand. Min., 2003.

• Donovan, "Core Community Specifications for Purchasing and Acceptance of Electron Beam Instruments" (M&M, 2005)
• Donovan and Rowe, "Techniques for Improving Quantitative Analysis of Mineral Glasses" (Goldschmidt, 2005)

• Donovan, et. al., "An Iterated Blank Correction for Improved Trace Element Accuracy in EPMA" (M&M, 2007)

• Phung, et. a l., "Determination of the Composition Ultra Thin Ni-Si Films" (X-ray Spectrometry, 2008)
• Meisenkothen and Donovan, "Specimen Heterogeneity Analysis: Revisted (M&M, 2008) (Abstract)
• Meisenkothen and Donovan, "Specimen Heterogeneity Analysis: Revisted (M&M, 2008) (Presentation)

• Escuder, et. al., "Numerical Correction for Secondary Fluorescence Across Phase Boundaries in EPMA", 11th European Workshop on Modern Developments and Applications in Microbeam Analysis IOP Publishing IOP Conf. Series: Materials Science and Engineering 7 (2010)

• Donovan, et. al., "Improved electron probe microanalysis of trace elements in quartz", American Mineralogist, 96, 274­282, 2011

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Have a question for the laboratory manager? My name is John Donovan. Please feel free to make suggestions to epmalab@uoregon.edu. Or via phone at (541) 346-4632, or try the lab phone at (541) 346-4655.